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Title

Defect filter construction [Dataset]

AuthorsLéger, G. ; Ginés, Antonio; Gutiérrez, Valentín; Barragán, Manuel J.
KeywordsTest
Integrated circuit
Defect
Machine-Learning
Issue Date2019
CitationG. Leger, A. Gines, V. Gutierrez, M.J. Barragan, J.(2019). Defect filter construction [Dataset],
AbstractThis data provides the THD measurement of an analog integrated circuit (a buffer) together with some indirect test signatures. Three cases are considered: a MonteCarlo simulation of mismatch variations, a MonteCarlo simulation of process variations and a defect simulation
DescriptionA detailed description can be found in the attached “readme.pdf” file. Datasets are subjected to a Creative Commons Attribution 4.0 International License
URIhttp://hdl.handle.net/10261/174650
DOIhttp://dx.doi.org/10.20350/digitalCSIC/8607
Appears in Collections:(IMSE-CNM) Conjuntos de datos
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