English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/174092
Share/Impact:
Statistics
logo share SHARE   Add this article to your Mendeley library MendeleyBASE
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:
Title

Diminish electrostatic in piezoresponse force microscopy through longer or ultra-stiff tips

AuthorsGómez Rodríguez, Andrés ; Puig Molina, Teresa ; Obradors, Xavier
KeywordsSurface science
Piezoresponse
Atomic force microscopy
Piezoelectricity
Ferroelectricity
Atomic force microscopy
Issue Date1-May-2018
PublisherElsevier
CitationApplied Surface Science 439: 577-582 (2018)
AbstractPiezoresponse Force Microscopy is a powerful but delicate nanoscale technique that measures the electromechanical response resulting from the application of a highly localized electric field. Though mechanical response is normally due to piezoelectricity, other physical phenomena, especially electrostatic interaction, can contribute to the signal read. We address this problematic through the use of longer ultra-stiff probes providing state of the art sensitivity, with the lowest electrostatic interaction and avoiding working in high frequency regime. In order to find this solution we develop a theoretical description addressing the effects of electrostatic contributions in the total cantilever vibration and its quantification for different setups. The theory is subsequently tested in a Periodically Poled Lithium Niobate (PPLN) crystal, a sample with well-defined 0° and 180° domains, using different commercial available conductive tips. We employ the theoretical description to compare the electrostatic contribution effects into the total phase recorded. Through experimental data our description is corroborated for each of the tested commercially available probes. We propose that a larger probe length can be a solution to avoid electrostatic forces, so the cantilever-sample electrostatic interaction is reduced. Our proposed solution has great implications into avoiding artifacts while studying soft biological samples, multiferroic oxides, and thin film ferroelectric materials.
Publisher version (URL)http://dx.doi.org/10.1016/j.apsusc.2018.01.080
URIhttp://hdl.handle.net/10261/174092
ISSN0169-4332
Appears in Collections:(ICMAB) Artículos
Files in This Item:
File Description SizeFormat 
Gomez_ApplSurfSci_2018_postprint.pdf Embargoed until May 1, 2020900,36 kBAdobe PDFThumbnail
View/Open    Request a copy
Show full item record
Review this work
 


WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.