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Diminish electrostatic in piezoresponse force microscopy through longer or ultra-stiff tips

AuthorsGómez Rodríguez, Andrés ; Puig Molina, Teresa ; Obradors, Xavier
KeywordsSurface science
Atomic force microscopy
Atomic force microscopy
Issue Date1-May-2018
CitationApplied Surface Science 439: 577-582 (2018)
AbstractPiezoresponse Force Microscopy is a powerful but delicate nanoscale technique that measures the electromechanical response resulting from the application of a highly localized electric field. Though mechanical response is normally due to piezoelectricity, other physical phenomena, especially electrostatic interaction, can contribute to the signal read. We address this problematic through the use of longer ultra-stiff probes providing state of the art sensitivity, with the lowest electrostatic interaction and avoiding working in high frequency regime. In order to find this solution we develop a theoretical description addressing the effects of electrostatic contributions in the total cantilever vibration and its quantification for different setups. The theory is subsequently tested in a Periodically Poled Lithium Niobate (PPLN) crystal, a sample with well-defined 0° and 180° domains, using different commercial available conductive tips. We employ the theoretical description to compare the electrostatic contribution effects into the total phase recorded. Through experimental data our description is corroborated for each of the tested commercially available probes. We propose that a larger probe length can be a solution to avoid electrostatic forces, so the cantilever-sample electrostatic interaction is reduced. Our proposed solution has great implications into avoiding artifacts while studying soft biological samples, multiferroic oxides, and thin film ferroelectric materials.
Publisher version (URL)http://dx.doi.org/10.1016/j.apsusc.2018.01.080
Appears in Collections:(ICMAB) Artículos
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