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dc.contributor.authorMundet, Bernates_ES
dc.contributor.authorJareño Cerulla, Juliaes_ES
dc.contributor.authorGázquez, Jaumees_ES
dc.contributor.authorVarela, Maríaes_ES
dc.contributor.authorObradors, Xavieres_ES
dc.contributor.authorPuig Molina, Teresaes_ES
dc.date.accessioned2019-01-11T11:22:23Z-
dc.date.available2019-01-11T11:22:23Z-
dc.date.issued2018-06-27-
dc.identifier.citationPhysical Review Materials 2(6): 063607 (2018)es_ES
dc.identifier.issn2475-9953-
dc.identifier.urihttp://hdl.handle.net/10261/173961-
dc.description.abstractIn this work we evaluate the defects and the associated distortions present in tensile and compressive-strained chemical solution deposition (CSD) derived NdNiO3 (NNO) and LaNiO3 (LNO) thin-films by means of aberration corrected Scanning Transmission Electron Microscopy (STEM). We elucidate a fundamental link between strain and the most common defect observed in Nickelate films, the Ruddlesden-Popper fault (RPF), which will ultimately impinge on the electrical properties of the films. Overall, the concentration of RPFs defects increases with the lattice mismatch. More specifically, LNO films are always metallic, although transitioning from compressive to tensile strain results in the appearance of RPFs and an increase of the resistivity. On the other hand, NNO films always behave as insulators under tensile strain, whereas under compressive strain the increase of the thickness makes the onset of the metal-to-insulator transition (MIT) to shift to higher temperatures.es_ES
dc.description.sponsorshipWe acknowledge financial support from Spanish Ministry of Economy and Competitiveness through the “Severo Ochoa” Programme for Centres of Excellence in R&D (SEV-2015-0496), CONSOLIDER Excellence Network (MAT2015-68994-REDC), COACHSUPENERGY project (MAT2014-51778-C2-1-R and BES-2015-072749 grant for B.M, co-financed by the European Regional Development Fund) and from the Catalan Government with 2017 SGR 1519 and Xarmae. J.J. acknowledges an FPU grant (FPU14/05960) from Ministerio español de Educación, Cultura y Deporte para la Formación de Profesorado Universitario and J.G. acknowledges the Ramon y Cajal program (RyC-2012–11709). The STEM microscopy work was conducted in the ICTS-CNME at UCM as well as at the Laboratorio de Microscopias Avanzadas (LMA) at Instituto de Nanociencia de Aragon (INA) at the University of Zaragoza. Authors acknowledge the ICTS-CNME for offering access to their instruments and expertise. Electron microscopy performed at the Centro Nacional de Microscopía Electrónica (UCM) were sponsored by the ERC Starting Investigator Award No. STEMOX#239739.es_ES
dc.language.isoenges_ES
dc.publisherAmerican Physical Societyes_ES
dc.relationMINECO/ICTI2013-2016/SEV-2015-0496es_ES
dc.relationinfo:eu-repo/grantAgreement/EC/FP7/239739es_ES
dc.relationMINECO/ICTI2013-2016/MAT2015-68994-REDCes_ES
dc.relationMINECO/ICTI2013-2016/MAT2014-51778-C2-1-Res_ES
dc.relationMINECO/ICTI2013-2016/BES-2015-072749es_ES
dc.relation.isversionofPostprintes_ES
dc.rightsopenAccesses_ES
dc.subjectMetal-insulator transitiones_ES
dc.subjectStraines_ES
dc.subjectOxideses_ES
dc.subjectThin filmses_ES
dc.subjectScanning transmission electron microscopyes_ES
dc.titleDefect landscape and electrical properties in solution-derived LaNiO3 and NdNiO3 epitaxial thin filmses_ES
dc.typeartículoes_ES
dc.description.peerreviewedPeer reviewedes_ES
dc.relation.publisherversionhttp://dx.doi.org/10.1103/PhysRevMaterials.2.063607es_ES
dc.contributor.funderMinisterio de Economía y Competitividad (España)es_ES
dc.contributor.funderGeneralitat de Catalunyaes_ES
dc.contributor.funderEuropean Research Counciles_ES
dc.relation.csices_ES
oprm.item.hasRevisionno ko 0 false*
dc.identifier.funderhttp://dx.doi.org/10.13039/501100003329es_ES
dc.identifier.funderhttp://dx.doi.org/10.13039/501100002809es_ES
dc.identifier.funderhttp://dx.doi.org/10.13039/501100000781es_ES
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