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Soft X-ray absorption spectroscopy study of the effects of Si, Ce, and Mo ion implantation on the passive layer of AISI 304 stainless steel

AuthorsLópez, María Francisca ; Gutiérrez, A.; Pérez Trujillo, F. J.; Hierro, M. P.; Pedraza, F.
KeywordsStainless steel
Ion implantation
Passive films
Issue DateSep-2003
CitationCorrosion Science 45(9): 2043-2053 (2003)
AbstractThe chemical modifications introduced in the passive layer of AISI 304 stainless steel after Si, Ce, and Mo ion implantation were investigated and compared with non-implanted steel by soft X-ray absorption spectroscopy. The influence of ion implantation on the passive properties was evaluated by measuring soft X-ray absorption spectra at the Cr, Fe, Ni, Mn and Si 2p in addition to oxygen 1s thresholds. All ion implanted samples show a relative Cr-enrichment at the surface as compared with non-implanted samples. Fe 2p as well as O 1s spectral changes reveal chemical differences in the passive layer as a function of the element ion-implanted.
Publisher version (URL)https://doi.org/10.1016/S0010-938X(03)00029-5
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