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dc.contributor.authorFerrero, Alejandro-
dc.contributor.authorStrothkämper, C.-
dc.contributor.authorBernad, Berta-
dc.contributor.authorQuast, T.-
dc.contributor.authorHauer, K.-O.-
dc.contributor.authorCampos Acosta, Joaquín-
dc.contributor.authorPons Aglio, Alicia-
dc.contributor.authorSchirmacher, A.-
dc.date.accessioned2018-07-16T11:48:44Z-
dc.date.available2018-07-16T11:48:44Z-
dc.date.issued2017-06-13-
dc.identifier.citation13th International Conference on New Developments and Applications in Optical Radiometry (2017)-
dc.identifier.urihttp://hdl.handle.net/10261/167631-
dc.descriptionNEWRAD 2017, Miraikan Hall, in Odaiba, Tokyo 13 - 16 June, 2017-
dc.description.abstractComparison of the reflectance properties of different diffuse reflectance standards provides guide to select the standard most adequate for a given application. IO-CSIC and PTB have studied the variation of the spectral BRDF with respect to the standard bidirectional geometry 0º:45º of the four most typical diffuse reflectance standards (barium sulphate, opal glass, ceramic tile and Spectralon), within the spectral range [380-1700] nm. IO-CSIC measured the variation in-plane spectral BRDF at several incidence angles, whereas PTB measured its out-ouf-plane variation at a fixed 45º incidence angle.-
dc.description.sponsorshipThis contribution was done within the EMRP IND52 Project xD-Reflect “Multidimensional reflectometry for industry”. The EMRP is jointly funded by the EMRP participating countries within EURAMET and the European Union. Authors from IO-CSIC, are also grateful to Comunidad de Madrid for funding the project SINFOTON-CM: S2013/MIT-2790.-
dc.publisherInstitute of Physics Publishing-
dc.relationS2013/MIT-2790/SINFOTON-CM-
dc.rightsopenAccess-
dc.titleBRDF variability of typical diffuse reflectance standards between 380 nm and 1700 nm-
dc.typePóster-
dc.date.updated2018-07-16T11:48:45Z-
dc.description.versionPeer Reviewed-
dc.language.rfc3066eng-
dc.contributor.funderEuropean Commission-
dc.contributor.funderComunidad de Madrid-
dc.contributor.funderEuropean Metrology Research Programme-
dc.relation.csic-
dc.identifier.funderhttp://dx.doi.org/10.13039/501100000780es_ES
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