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Arrays of suspended silicon nanowires defined by ion beam implantation: mechanical coupling and combination with CMOS technology

AutorLlobet, Jordi; Rius, Gemma; Chuquitarqui, Alex; Borrisé, Xavier ; Perez Murano, Francesc X.
Palabras claveNanowires
Focused Ion Beam
Fecha de publicación22-feb-2018
EditorInstitute of Physics (Great Britain)
ResumenWe present the fabrication, operation, and CMOS integration of arrays of suspended silicon nanowires (SiNWs). The functional structures are obtained by a top-down fabrication approach consisting in a resistless process based on focused ion beam irradiation, causing local gallium implantation and silicon amorphization, plus selective silicon etching by tetramethylammonium hydroxide, and a thermal annealing process in a boron rich atmosphere. The last step enables the electrical functionality of the irradiated material. Doubly clamped silicon beams are fabricated by this method. The electrical readout of their mechanical response can be addressed by a frequency down-mixing detection technique thanks to an enhanced piezoresistive transduction mechanism. Three specific aspects are discussed: i) the engineering of mechanically coupled SiNWs, by making use of the nanometer scale overhang that it is inherently-generated with this fabrication process, ii) the statistical distribution of patterned lateral dimensions when fabricating large arrays of identical devices, and iii) the compatibility of the patterning methodology with CMOS circuits. Our results suggest that the application of this method to the integration of large arrays of suspended SiNWs with CMOS circuitry is interesting in view of applications such as advanced radio frequency band pass filters and ultra-high-sensitivity mass sensors.
Versión del editorhttps://doi.org/10.1088/1361-6528/aaac67
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