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dc.contributor.authorHerrero-Bermello, A.-
dc.contributor.authorVelasco, Aitor V.-
dc.contributor.authorPodmore, Hugh-
dc.contributor.authorCheben, Pavel-
dc.contributor.authorSchmid, Jens H.-
dc.contributor.authorJanz, S.-
dc.contributor.authorCalvo, María L.-
dc.contributor.authorXu, Dan-Xia-
dc.contributor.authorScott, Alan-
dc.contributor.authorCorredera, Pedro-
dc.date.accessioned2018-04-24T07:15:29Z-
dc.date.available2018-04-24T07:15:29Z-
dc.date.issued2017-06-01-
dc.identifierdoi: 10.1364/OL.42.002239-
dc.identifierissn: 1539-4794-
dc.identifier.citationOptics Letters 42(11): 2239-2242 (2017)-
dc.identifier.urihttp://hdl.handle.net/10261/164048-
dc.description4 pags., 5 figs.-
dc.description.abstractWe present two techniques for mitigating the effects of temperature drifts in waveguide spatial heterodyne Fourier-transform on-chip spectrometers. In high-resolution devices, large optical path length differences result in an increased sensitivity to temperature variations and impose stringent requirements on the thermal stabilization system. In order to overcome this limitation, here we experimentally demonstrate two new temperature mitigation techniques based on a temperature-sensitive calibration and phase error correction. The spectrometer chip under analysis comprises an array of 32 Mach¿Zehnder interferometers fabricated on a silicon-on-insulator platform. The optical path delays are implemented as microphotonic spirals of linearly increasing length up to 3.779 cm, yielding a spectral resolution of 17 pm. We demonstrate that the degradation in retrieved spectra caused by temperature drift is effectively eliminated by temperature-sensitive calibration and phase error correction.-
dc.description.sponsorshipMinisterio de Economía y Competitividad (MINECO) (FJCI-2014-22836, TEC2015-71127-C2-1-R, TEC2015-71127-C2-2-R); Comunidad de Madrid (S2013/ MIT-2790); EURAMET (H2020-MSCA-RISE-2016: SENSIBLE); EMPIR Programme (JRP-i22 14IND13- PhotInd); National Research Council Canada (NRC); Horizon 2020 Framework Programme (H2020) (734331).-
dc.publisherOptical Society of America-
dc.relationinfo:eu-repo/grantAgreement/EC/H2020/734331-
dc.relationinfo:eu-repo/grantAgreement/MINECO/Plan Estatal de Investigación Científica y Técnica y de Innovación 2013-2016/FJCI-2014-22836-
dc.relationinfo:eu-repo/grantAgreement/MINECO/Plan Estatal de Investigación Científica y Técnica y de Innovación 2013-2016/TEC2015-71127-C2-1-R-
dc.relationinfo:eu-repo/grantAgreement/MINECO/Plan Estatal de Investigación Científica y Técnica y de Innovación 2013-2016/TEC2015-71127-C2-2-R-
dc.relationS2013/MIT-2790/SINFOTON-CM-
dc.relation.isversionofPostprint-
dc.rightsopenAccessen_EN
dc.titleTemperature dependence mitigation in stationary Fourier-transform on-chip spectrometers-
dc.typeartículo-
dc.identifier.doi10.1364/OL.42.002239-
dc.relation.publisherversionhttps://doi.org/10.1364/OL.42.002239-
dc.date.updated2018-04-24T07:15:29Z-
dc.description.versionPeer Reviewed-
dc.language.rfc3066eng-
dc.contributor.funderComunidad de Madrid-
dc.contributor.funderMinisterio de Economía y Competitividad (España)-
dc.contributor.funderEuropean Commission-
dc.contributor.funderEuropean Metrology Research Programme-
dc.contributor.funderNational Research Council of Canada-
dc.relation.csic-
dc.identifier.funderhttp://dx.doi.org/10.13039/501100000046es_ES
dc.identifier.funderhttp://dx.doi.org/10.13039/501100003329es_ES
dc.identifier.funderhttp://dx.doi.org/10.13039/501100000780es_ES
dc.identifier.funderhttp://dx.doi.org/10.13039/100012818es_ES
dc.type.coarhttp://purl.org/coar/resource_type/c_6501es_ES
item.fulltextWith Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
item.grantfulltextopen-
item.openairetypeartículo-
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