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Untangling surface oxygen exchange effects in YBa2Cu3O6+x thin films by electrical conductivity relaxation

AutorCayado, Pablo ; Sánchez Valdés, César Fidel; Stangl , Alexander ; Coll, Mariona ; Roura, Pere; Palau, Anna ; Puig Molina, Teresa ; Obradors, Xavier
Palabras claveOxide fuel-.cells
Coated conductors
Chemical diffusion
Resistivity measurements
YBa2Cu3O7-delta films
Critical currents
Isotope-exchange
Single-crystals
SrTiO3
Superconductors
Fecha de publicación7-jun-2017
EditorRoyal Society of Chemistry (Great Britain)
CitaciónPhysical Chemistry Chemical Physics 19(21): 14129-14140 (2017)
ResumenThe kinetics of oxygen incorporation (in-diffusion process) and excorporation (out-diffusion process), in YBa2Cu3O6+x (YBCO) epitaxial thin films prepared using the chemical solution deposition (CSD) methodology by the trifluoroacetate route, was investigated by electrical conductivity relaxation measurements. We show that the oxygenation kinetics of YBCO films is limited by the surface exchange process of oxygen molecules prior to bulk diffusion into the films. The analysis of the temperature and oxygen partial pressure influence on the oxygenation kinetics has drawn a consistent picture of the oxygen surface exchange process enabling us to define the most likely rate determining step. We have also established a strategy to accelerate the oxygenation kinetics at low temperatures based on the catalytic influence of Ag coatings thus allowing us to decrease the oxygenation temperature in the YBCO thin films.
Versión del editorhttp://dx.doi.org/10.1039/C7CP01855J
URIhttp://hdl.handle.net/10261/159839
ISSN1463-9076
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