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dc.contributor.authorMartín Holgado, Pedro-
dc.contributor.authorMorilla, Yolanda-
dc.date.accessioned2017-12-29T10:10:57Z-
dc.date.available2017-12-29T10:10:57Z-
dc.date.issued2016-
dc.identifier.citationRADECS 2016-
dc.identifier.urihttp://hdl.handle.net/10261/158662-
dc.descriptionResumen del trabajo presentado a la 16th European Conference on Radiation and its Effects on Components and Systems, celebrada en Bremen (Alemania) del 19 al 23 de septiembre de 2016.-- et al.-
dc.description.abstractPolymer tantalum capacitor technology was developed in response to demands from the market to lower the ESR of tantalum capacitors while preserving their small case size and high reliability. The technology is promising in several aspects. The higher quality interface between the dielectric and the polymer cathode increases the breakdown voltage of the device, as well as reducing its DC leakage current, even at extreme radiation exposure conditions.-
dc.rightsclosedAccess-
dc.titleRadiation characterisation for new tantalum polymer capacitors-
dc.typecomunicación de congreso-
dc.date.updated2017-12-29T10:11:10Z-
dc.description.versionPeer Reviewed-
dc.language.rfc3066eng-
dc.relation.csic-
Appears in Collections:(CNA) Comunicaciones congresos
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