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Evaluation of the dielectric function of colloidal Cd1 − xHgxTe quantum dot films by spectroscopic ellipsometry

AutorBejaoui, A.; Alonso Carmona, M. Isabel ; Garriga Bacardi, Miquel ; Campoy Quiles, Mariano ; Goñi, Alejandro R. ; Zapien, J. Antonio
Palabras claveCd1 − xHgxTe
Colloidal quantum dots
Spectroscopic ellipsometry
Ion exchange
Dielectric function
Fecha de publicación1-nov-2017
EditorElsevier
CitaciónApplied Surface Science 421(Part B): 295-300 (2017)
ResumenWe report on the investigation by spectroscopic ellipsometry of films containing Cd1 − xHgxTe alloy quantum dots (QDs). The alloy QDs were fabricated from colloidal CdTe QDs grown by an aqueous synthesis process followed by an ion-exchange step in which Hg2+ ions progressively replace Cd2+. For ellipsometric studies, several films were prepared on glass substrates using layer-by-layer (LBL) deposition. The contribution of the QDs to the measured ellipsometric spectra is extracted from a multi-sample, transmission and multi- angle-of-incidence ellipsometric data analysis fitted using standard multilayer and effective medium models that include surface roughness effects, modeled by an effective medium approximation. The relationship of the dielectric function of the QDs retrieved from these studies to that of the corresponding II–VI bulk material counterparts is presented and discussed.
DescripciónBejaoui, A. et al.
Versión del editorhttp://dx.doi.org/10.1016/j.apsusc.2016.09.070
URIhttp://hdl.handle.net/10261/155949
DOI10.1016/j.apsusc.2016.09.070
ISSN0169-4332
E-ISSN1873-5584
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