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Evaluation of the dielectric function of colloidal Cd1 − xHgxTe quantum dot films by spectroscopic ellipsometry

AuthorsBejaoui, A.; Alonso Carmona, M. Isabel ; Garriga Bacardi, Miquel ; Campoy Quiles, Mariano ; Goñi, Alejandro R. ; Zapien, J. Antonio
KeywordsCd1 − xHgxTe
Colloidal quantum dots
Spectroscopic ellipsometry
Ion exchange
Dielectric function
Issue Date1-Nov-2017
CitationApplied Surface Science 421(Part B): 295-300 (2017)
AbstractWe report on the investigation by spectroscopic ellipsometry of films containing Cd1 − xHgxTe alloy quantum dots (QDs). The alloy QDs were fabricated from colloidal CdTe QDs grown by an aqueous synthesis process followed by an ion-exchange step in which Hg2+ ions progressively replace Cd2+. For ellipsometric studies, several films were prepared on glass substrates using layer-by-layer (LBL) deposition. The contribution of the QDs to the measured ellipsometric spectra is extracted from a multi-sample, transmission and multi- angle-of-incidence ellipsometric data analysis fitted using standard multilayer and effective medium models that include surface roughness effects, modeled by an effective medium approximation. The relationship of the dielectric function of the QDs retrieved from these studies to that of the corresponding II–VI bulk material counterparts is presented and discussed.
DescriptionBejaoui, A. et al.
Publisher version (URL)http://dx.doi.org/10.1016/j.apsusc.2016.09.070
Appears in Collections:(ICMAB) Artículos
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