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| Título: | Dielectric characterization of multiferroic magnetoelectric double-perovskite Y(Ni0.5Mn0.5)O3 thin films |
Autor: | Coy, L.E.; Fina, Ignasi CSIC ORCID CVN ; Ventura Altozano, Jofre; Yate, L.; Langenberg, Eric CSIC ORCID; Polo, Mª. del Carmen; Ferrater Martorell, César; Varela, M. | Palabras clave: | Dielectric thin films Ferroelectric materials Polarization Ferromagnetic materials Ferroelectric thin films |
Fecha de publicación: | 10-oct-2016 | Editor: | American Institute of Physics | Citación: | Applied Physics Letters 109(15): 152901 (2016) | Resumen: | We report on the functional properties of the Y(Ni0.5Mn0.5)O3 epitaxial thin films, growth by pulsed laser deposition, observing the clear features of their ferroelectric and ferromagnetic nature at cryogenic temperature. The characterization of temperature-dependent complex impedance spectroscopy has shown a dielectric anomaly around the ferromagnetic Curie temperature (100 K) indicative of coupling between magnetic and electric orders. | Versión del editor: | http://dx.doi.org/10.1063/1.4964439 | URI: | http://hdl.handle.net/10261/148107 | DOI: | 10.1063/1.4964439 | ISSN: | 0003-6951 |
| Aparece en las colecciones: | (ICMA) Artículos (ICMAB) Artículos |
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| Fichero | Descripción | Tamaño | Formato | |
|---|---|---|---|---|
| Coy_ApplPhysLett_2016_postprint.pdf | 796,5 kB | Adobe PDF |  Visualizar/Abrir |
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