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Dielectric characterization of multiferroic magnetoelectric double-perovskite Y(Ni0.5Mn0.5)O3 thin films

AuthorsCoy, L. E.; Fina, Ignasi ; Ventura Altozano, Jofre; Yate, L.; Langenberg, Eric; Polo, Mª. del Carmen; Ferrater Martorell, César; Varela, M.
KeywordsDielectric thin films
Ferroelectric materials
Ferromagnetic materials
Ferroelectric thin films
Issue Date10-Oct-2016
PublisherAmerican Institute of Physics
CitationApplied Physics Letters 109(15): 152901 (2016)
AbstractWe report on the functional properties of the Y(Ni0.5Mn0.5)O3 epitaxial thin films, growth by pulsed laser deposition, observing the clear features of their ferroelectric and ferromagnetic nature at cryogenic temperature. The characterization of temperature-dependent complex impedance spectroscopy has shown a dielectric anomaly around the ferromagnetic Curie temperature (100 K) indicative of coupling between magnetic and electric orders.
Publisher version (URL)http://dx.doi.org/10.1063/1.4964439
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