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Título

Electron backscattering diffraction as a complementary analytical approach to the microstructural characterization of ancient materials by electron microscopy

AutorPérez-Arantegui, J.; Larrea, A.
Palabras claveElectron microscopy
Materials characterization
Scanning electron microscopy
SEM-EBSD
EBSD
Archaeology
Art
Crystallography
Cuprorivaite
Electron backscattering diffraction
Fecha de publicación2015
EditorElsevier
CitaciónTrAC Trends in Analytical Chemistry 72: 193-201 (2015)
ResumenSince the development of electron backscattering diffraction (EBSD), scanning electron microscopy (SEM) has become a powerful tool for characterizing the local crystallography of bulk materials at the nanoscale. Although EBSD is now a well-established characterization method in materials science, it has rarely been used in art and archaeology, and nearly exclusively in metallic materials. However, EBSD could also be exploited to characterize ancient materials and to highlight their local crystallography (e.g., in the study of natural or artificial pigments). We discuss the potential of EBSD, as outlined in studies and from its application with an ancient material - Egyptian blue - in identification of crystalline phases, drawing phase maps, and the extraction of several microstructural parameters (e.g., the grain size and the aspect-ratio distribution of phases).
Versión del editorhttps://doi.org/10.1016/j.trac.2015.03.026
URIhttp://hdl.handle.net/10261/147677
DOI10.1016/j.trac.2015.03.026
Identificadoresdoi: 10.1016/j.trac.2015.03.026
issn: 0167-2940
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