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Multiple strain-induced phase transitions in LaNiO3 thin films

AutorWeber, M.C.; Dix, Nico ; Pesquera, David ; Sánchez Barrera, Florencio ; Herranz, Gervasi ; Fontcuberta, Josep ; Íñiguez, Jorge ; Kreisel, J.
Palabras claveAugmented-wave method
Oxide superlattices
Mode spectroscopy
Scattering
Fecha de publicación29-jul-2016
EditorAmerican Physical Society
CitaciónPhysical Review - Section B 94: 014118 (2016)
ResumenStrain effects on epitaxial thin films of LaNiO3 grown on different single crystalline substrates are studied by Raman scattering and first-principles simulation. New Raman modes, not present in bulk or fully-relaxed films, appear under both compressive and tensile strains, indicating symmetry reductions. Interestingly, the Raman spectra and the underlying crystal symmetry for tensile and compressively strained films are different. Extensive mapping of LaNiO3 phase stability is addressed by simulations, showing that a variety of crystalline phases are indeed stabilized under strain which may impact the electronic orbital hierarchy. The calculated Raman frequencies reproduce the principal features of the experimental spectra, supporting the validity of the multiple strain-driven structural transitions predicted by the simulations.
DescripciónWeber, M.C. et al.
Versión del editorhttp://dx.doi.org/10.1103/PhysRevB.94.014118
URIhttp://hdl.handle.net/10261/146992
DOI10.1103/PhysRevB.94.014118
ISSN2469-9950
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