English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/143040
logo share SHARE logo core CORE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL | DATACITE
Exportar a otros formatos:


Analyzing the scale of the bainitic ferrite plates by XRD, SEM and TEM

AuthorsGarcía Mateo, Carlos ; Jiménez, José Antonio; López-Ezquerra, B.; Rementería, Rosalía; Morales-Rivas, Lucía; Kuntz, M.; García Caballero, Francisca
KeywordsPlate thickness
Microstructural characterization
Crystallite size
Issue Date2016
CitationMaterials Characterization 122: 83-89 (2016)
AbstractSince the major strengthening mechanisms in nanocrystalline bainitic steels arise from the exceptionally small size of the bainitc ferrite plate, accurate determination of this parameter is fundamental for quantitative relating the microstructure to the mechanical properties. In this work, the thickness of the bainitic ferrite subunits obtained by different bainitic heat treatments was determined in two steels, with carbon contents of 0.3 and 0.7 wt.%, from SEM and TEM micrographs. As these measurements were made on 2D images taken from random sections, the method includes some stereological correction factors to obtain accurate information. Finally, the determined thicknesses of bainitic ferrite plates were compared with the crystallite size calculated from the analysis of X-ray diffraction peak broadening. Although in some case the values obtained for crystallite size and plate thickness can be similar, this study confirms that indeed they are two different parameters.
Publisher version (URL)http://dx.doi.org/10.1016/j.matchar.2016.10.023
Identifiersdoi: 10.1016/j.matchar.2016.10.023
issn: 1044-5803
Appears in Collections:(CENIM) Artículos
Files in This Item:
File Description SizeFormat 
accesoRestringido.pdf15,38 kBAdobe PDFThumbnail
Show full item record
Review this work

WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.