English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/137537
logo share SHARE   Add this article to your Mendeley library MendeleyBASE
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:

On the mechanical and electronic properties of alkylthiolated Au nanoelectrode molecular junctions

AuthorsSmaali, K.; Foti, Giuseppe; Sánchez-Portal, Daniel ; Arnau, Andrés ; Vuillaume, D.; Clément, N.
Issue Date2015
CitationSYMOLESCO Workshop (2015)
AbstractDue to their exceptional chemical, physical, and electric properties, gold nanoparticles (NPs) are applied in many fields, ranging from nanoelectronics, nanotechnology, and catalysis to biomedicine. Furthermore, electronic properties can be tuned by functionalization with different capping layers. Here, we present a quantitative exploration, combining experiment and simulation, of the mechanical and electronic properties, as well as the modifications induced by an alkylthiolated coating, at the single NP level. We determine the response of the NPs to external pressure in a controlled manner by using an atomic force microscope tip (peak-force TUNA). We find a strong reduction of their Young modulus, as compared to bulk gold, and a significant influence of strain in the electronic properties of the alkylthiolated NPs. Electron transport measurements of tiny molecular junctions (NP/alkylthiol/CAFM tip) show that the effective tunneling barrier through the adsorbed monolayer strongly decreases with increasing the applied load, which translates in a remarkable and unprecedented increase of the tunnel current. These observations are successfully explained using simulations based on finite element analysis (FEA) and first-principles calculations that permit to consider the coupling between the mechanical response of the system and the electric dipole variations at the interface.
DescriptionResumen del trabajo presentado al 1st Annual Meeting and Joint MOLESCO-SYMONE Workshop, celebrado en Engelberg (Suiza) del 8 al 11 de febrero de 2015.
Appears in Collections:(CFM) Comunicaciones congresos
Files in This Item:
File Description SizeFormat 
accesoRestringido.pdf15,38 kBAdobe PDFThumbnail
Show full item record
Review this work

WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.