Por favor, use este identificador para citar o enlazar a este item: http://hdl.handle.net/10261/13707
COMPARTIR / EXPORTAR:
logo share SHARE logo core CORE BASE
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL | DATACITE

Invitar a revisión por pares abierta
Campo DC Valor Lengua/Idioma
dc.contributor.authorSkuza, J. R.-
dc.contributor.authorLukaszew, R. A.-
dc.contributor.authorDufresne, E. M.-
dc.contributor.authorWalko, D. A.-
dc.contributor.authorClavero Pérez, César-
dc.contributor.authorCebollada, Alfonso-
dc.contributor.authorCionca, C.-
dc.date.accessioned2009-06-16T08:12:36Z-
dc.date.available2009-06-16T08:12:36Z-
dc.date.issued2007-06-18-
dc.identifier.citationApplied Physics Letters 90, 251901 (2007)en_US
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10261/13707-
dc.description.abstractModification of chemical order in epitaxial FePt binary alloy thin films deposited on MgO (100) substrates was induced and investigated in real time using x-ray rapid thermal annealing (XRTA). This is possible because synchrotron undulator radiation has sufficient power density to induce significant structural modifications in thin films and its energy can be tuned to optimize absorption in the sample. A monochromatic portion of the pink beam diffracted from the epitaxial FePt sample was used to probe microstructure evolution in real time and significant changes in chemical order were observed. In particular, the relative amount of L10 phase remained practically unchanged whereas the amount of L12 phase was significantly decreased in the FePt thin film sample during XRTA.en_US
dc.description.sponsorshipThis work was performed in part at beamline 7-ID. Use of the Advanced Photon Source was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. This work was partially supported by DOE Grant DE-FG02-06ER46273, NSF-DMR (Grant No. 0355171), the American Chemical Society (PRF Grant No. 41319-AC), the Research Corporation Cottrell Scholar award, the Spanish Ministerio of Educación y Ciencia, and the FPI Program.en_US
dc.format.extent164765 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoengen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rightsopenAccessen_US
dc.subjectIron alloysen_US
dc.subjectPlatinum alloysen_US
dc.subjectMetallic epitaxial layersen_US
dc.subjectRapid thermal annealingen_US
dc.subjectSolid-state phase transformationsen_US
dc.titleReal time structural modification of epitaxial FePt thin films under x-ray rapid thermal annealing using undulator radiationen_US
dc.typeartículoen_US
dc.identifier.doi10.1063/1.2749426-
dc.description.peerreviewedPeer revieweden_US
dc.relation.publisherversionhttp://link.aip.org/link/?APPLAB/90/251901/1en_US
dc.relation.publisherversionhttp://dx.doi.org/10.1063/1.2749426en_US
dc.type.coarhttp://purl.org/coar/resource_type/c_6501es_ES
item.openairetypeartículo-
item.cerifentitytypePublications-
item.languageiso639-1en-
item.grantfulltextopen-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.fulltextWith Fulltext-
Aparece en las colecciones: (IMN-CNM) Artículos
Ficheros en este ítem:
Fichero Descripción Tamaño Formato
Skuza, J.R. et al_Appl.Phys.Lett_90_2007.pdf160,9 kBAdobe PDFVista previa
Visualizar/Abrir
Show simple item record

CORE Recommender

SCOPUSTM   
Citations

6
checked on 21-mar-2024

WEB OF SCIENCETM
Citations

5
checked on 26-feb-2024

Page view(s)

374
checked on 28-mar-2024

Download(s)

321
checked on 28-mar-2024

Google ScholarTM

Check

Altmetric

Altmetric


NOTA: Los ítems de Digital.CSIC están protegidos por copyright, con todos los derechos reservados, a menos que se indique lo contrario.