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Título

Ferromagnetic-insulator-based superconducting junctions as sensitive electron thermometers

AutorGiazotto, Francesco; Solinas, P.; Braggio, Alessandro; Bergeret, F. S. CSIC ORCID
Fecha de publicación2015
EditorAmerican Physical Society
CitaciónPhysical Review Applied 4(4): 044016 (2015)
ResumenWe present an exhaustive theoretical analysis of charge and thermoelectric transport in a normal-metal-ferromagnetic-insulator-superconductor junction and explore the possibility of its use as a sensitive thermometer. We investigate the transfer functions and the intrinsic noise performance for different measurement configurations. A common feature of all configurations is that the best temperature-noise performance is obtained in the nonlinear temperature regime for a structure based on an Europium chalcogenide ferromagnetic insulator in contact with a superconducting Al film structure. For an open-circuit configuration, although the maximal intrinsic temperature sensitivity can achieve 10 nK Hz-1/2, a realistic amplifying chain will reduce the sensitivity up to 10 μK Hz-1/2. To overcome this limitation, we propose a measurement scheme in a closed-circuit configuration based on state-of-the-art superconducting-quantum-interference-device detection technology in an inductive setup. In such a case, we show that temperature-noise can be as low as 35 nK Hz-1/2. We also discuss a temperature-to-frequency converter where the obtained thermovoltage developed over a Josephson junction operated in the dissipative regime is converted into a high-frequency signal. We predict that the structure can generate frequencies up to approximately 120 GHz and transfer functions up to 200 GHz/K at around 1 K. If operated as an electron thermometer, the device may provide temperature-noise lower than 35 nK Hz-1/2 thereby being potentially attractive for radiation-sensing applications.
DescripciónUnder the terms of the Creative Commons Attribution License 3.0 (CC-BY).
Versión del editorhttp://dx.doi.org/10.1103/PhysRevApplied.4.044016
URIhttp://hdl.handle.net/10261/136440
DOI10.1103/PhysRevApplied.4.044016
Identificadoresdoi: 10.1103/PhysRevApplied.4.044016
e-issn: 2331-7019
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