English   español  
Por favor, use este identificador para citar o enlazar a este item: http://hdl.handle.net/10261/135568
COMPARTIR / IMPACTO:
Estadísticas
logo share SHARE logo core CORE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:
Título

Local charge measurement using off-axis electron holography

AutorBeleggia, M.; Gontard, Lionel C. ; Dunin-Borkowski, Rafal E.
Palabras claveElectron holography,
Electrostatics,
Dielectric nanoparticles
Charge measurement
Electrostatic potential
Fecha de publicación2016
EditorInstitute of Physics Publishing
CitaciónJournal of Physics D: Applied Physics, 49 (2016) 294003
ResumenA model-independent approach based on Gauss’ theorem for measuring the local charge in a specimen from an electron-optical phase image recorded using off-axis electron holography was recently proposed. Here, we show that such a charge measurement is reliable when it is applied to determine the total charge enclosed within an object. However, the situation is more complicated for a partial charge measurement when the integration domain encloses only part of the object. We analyze in detail the effects on charge measurement of the mean inner potential of the object, of the presence of induced charges on nearby supports/electrodes and of noise. We perform calculations for spherical particles and highlight the differences when dealing with other object shapes. Our analysis is tested using numerical simulations and applied to the interpretation of an experimental dataset recorded from a sapphire particle
Versión del editorhttp://dx.doi.org/10.1088/0022-3727/49/29/294003
URIhttp://hdl.handle.net/10261/135568
DOI10.1088/0022-3727/49/29/294003
Aparece en las colecciones: (ICMS) Artículos
Ficheros en este ítem:
Fichero Descripción Tamaño Formato  
d_49_29_294003.pdf1,96 MBAdobe PDFVista previa
Visualizar/Abrir
Mostrar el registro completo
 

Artículos relacionados:


NOTA: Los ítems de Digital.CSIC están protegidos por copyright, con todos los derechos reservados, a menos que se indique lo contrario.