English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/135568
logo share SHARE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:

Local charge measurement using off-axis electron holography

AuthorsBeleggia, M.; Gontard, Lionel C. ; Dunin-Borkowski, Rafal E.
KeywordsElectron holography,
Dielectric nanoparticles
Charge measurement
Electrostatic potential
Issue Date2016
PublisherInstitute of Physics Publishing
CitationJournal of Physics D: Applied Physics, 49 (2016) 294003
AbstractA model-independent approach based on Gauss’ theorem for measuring the local charge in a specimen from an electron-optical phase image recorded using off-axis electron holography was recently proposed. Here, we show that such a charge measurement is reliable when it is applied to determine the total charge enclosed within an object. However, the situation is more complicated for a partial charge measurement when the integration domain encloses only part of the object. We analyze in detail the effects on charge measurement of the mean inner potential of the object, of the presence of induced charges on nearby supports/electrodes and of noise. We perform calculations for spherical particles and highlight the differences when dealing with other object shapes. Our analysis is tested using numerical simulations and applied to the interpretation of an experimental dataset recorded from a sapphire particle
Publisher version (URL)http://dx.doi.org/10.1088/0022-3727/49/29/294003
Appears in Collections:(ICMS) Artículos
Files in This Item:
File Description SizeFormat 
d_49_29_294003.pdf1,96 MBAdobe PDFThumbnail
Show full item record
Review this work

WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.