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Modification of AFM tips by depositing nanoparticles with an Ion Cluster Source. Enhancement of the aspect-ratio and lateral resolution

AuthorsMartínez-Orellana, Lidia ; Tello Ruiz, Marta ; Díaz Lagos, Mercedes ; Román García, Elisa Leonor ; García García, Ricardo ; Huttel, Yves
Issue DateApr-2011
CitationNanoSpain Conference (2011)
AbstractOne of the factors that limit the spatial resolution in atomic force microscopy (AFM) is the physical size of the probe. This limitation is particularly severe when the imaged structures are comparable in size to the tip¿s apex. The resolution in the AFM is usually enhanced by using sharp tips with high aspect ratios. In the present paper we propose an approach to modify AFM tips that consists of depositing nanoclusters on standard silicon tips. We show that the use of those tips leads to atomic force microscopy images of higher aspect ratios and spatial resolution. The present approach has two major properties. It provides higher aspect-ratio images of nanoscale objects and, at the same time, enables to functionalize the AFM tips by depositing nanoparticles with well-controlled chemical composition.
DescriptionPóster presentado en la NanoSpain Conference (Nanoiberian Conference), celebrada en Bilbao del 11 al 14 de abril de 2011.
Appears in Collections:(ICMM) Comunicaciones congresos
(IMN-CNM) Comunicaciones congresos
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