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Optical constants of SrF2 thin films in the 25-780-eV spectral range

AutorRodríguez de Marcos, Luís ; Larruquert, Juan Ignacio ; Aznárez, José Antonio ; Soufli, R.; Méndez, José Antonio ; Baker, Sherry L.; Gullikson, Eric M.
Fecha de publicación8-abr-2013
EditorAmerican Institute of Physics
CitaciónJournal of Applied Physics 113: 14350- 14358 (2013)
ResumenThe transmittance and the optical constants of SrF2 thin films, a candidate material for multilayer coatings operating in the extreme ultraviolet and soft x-rays, have been determined in the spectral range of 25¿780¿eV, in most of which no experimental data were previously available. SrF2 films of various thicknesses were deposited by evaporation onto room-temperature, thin Al support films, and their transmittance was measured with synchrotron radiation. The transmittance as a function of film thickness was used to calculate the extinction coefficient k at each photon energy. A decrease in density with increasing SrF2 film thickness was observed. In the calculation of k, this effect was circumvented by fitting the transmittance versus the product of thickness and density. The real part of the refractive index of SrF2 films was calculated from k with Kramers-Krönig analysis, for which the measured spectral range was extended both to lower and to higher photon energies with data in the literature combined with interpolations and extrapolations. With the application of f- and inertial sum rules, the consistency of the compiled data was found to be excellent. . VC 2013 American Institute of Physics.
Descripción8 págs.; 11 figs.; 1 tab.
Versión del editorhttp://dx.doi.org/10.1063/1.4800099
Identificadoresdoi: 10.1063/1.4800099
issn: 0021-8979
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