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Spatially resolved X-ray excited optical luminescence

AutorMartínez-Criado, Gema; Alén, Benito ; Sans, Juan Ángel; Homs, Alejandro; Kieffer, I.; Tucoulou, Rémi; Cloetens, P.; Segura-Ruiz, Jaime; Susini, Jean; Yoo, Jinkyoung; Yi, J. G. C.
Palabras claveSynchrotron Radiation
Luminescence
Microscopy
Fecha de publicación1-ago-2012
EditorElsevier
CitaciónNuclear Instruments and Methods in Physics Research - Section B 284: 36- 39 (2012)
ResumenSpatially resolved luminescence distributions in semiconductor heterostructures were investigated by core level excitation using hard X-ray (sub-) microbeams. Compact and mobile XEOL instruments have been developed and well adapted on the hard X-ray beamline ID22 of the European Synchrotron Radiation Facility for different wavelength collection ranges: UV-VIS and NIR. Linked by multimode optical fibers, their special designs provide precise scanning microscopy and allow easy access for multiple detection modes. Based on the hard X-ray microprobe station of ID22, details of the equipments, spectral data and representative examples are briefly described. Data collections from InAs and InGaN quantum heterostructures support the excellent performance of the optical devices. © 2011 Elsevier B.V. All rights reserved.
Versión del editorhttp://dx.doi.org/10.1016/j.nimb.2011.08.013
URIhttp://hdl.handle.net/10261/133794
DOI10.1016/j.nimb.2011.08.013
Identificadoresissn: 0168-583X
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