English   español  
Por favor, use este identificador para citar o enlazar a este item: http://hdl.handle.net/10261/133427
logo share SHARE logo core CORE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:

Heat treatment effects on electrochemically grown Bi 2Te 3 thin films for thermoelectric applications

AutorDeb, Biswapriya; Isoda, Yukihiro; Caballero-Calero, Olga ; Díaz Chao, Pablo ; Martín-González, Marisol S. ; Shinohara, Yoshikazu
Palabras claveHeat treatment
Substrate effect
Seebeck coefficient
Fecha de publicación2012
EditorJapan Institute of Metals
CitaciónMaterials Transactions 53(8): 1481-1485 (2012)
ResumenBi 2Te 3 thin films were grown on a large area of n-Si/Ti/Au substrate by an electrochemical process. The synthesized film sample was cut into four different pieces and each piece underwent different heat treatments for 1 h to optimize their carrier concentration. Heat treatment experiments were performed in an inert atmosphere to prevent oxidation of the films during the treatment. X-ray diffraction showed an increase in the crystallite size with increasing annealing temperatures, which affected the thermoelectric performances of the films. At room temperature, the Seebeck coefficient and electrical resistivity were measured using a custom-built setup. Initially, the measured conductivity appeared to be ntype for all films backed by the metal buffer layer and Si substrate. A simple model that could classify the substrate contribution on the overall transport properties was then developed. The model confirmed that the actual conductivities of the films were p-type, and this was supported by their elemental analysis. © 2012 The Japan Institute of Metals.
Versión del editorhttp://dx.doi.org/10.2320/matertrans.ME201106
Identificadoresissn: 1345-9678
e-issn: 1347-5320
Aparece en las colecciones: (IMN-CNM) Artículos
Ficheros en este ítem:
Fichero Descripción Tamaño Formato  
accesoRestringido.pdf15,38 kBAdobe PDFVista previa
Mostrar el registro completo

Artículos relacionados:

NOTA: Los ítems de Digital.CSIC están protegidos por copyright, con todos los derechos reservados, a menos que se indique lo contrario.