English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/133071
logo share SHARE logo core CORE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:


Sub-nanometer resolution of an organic semiconductor crystal surface using friction force microscopy in water

AuthorsPimentel, Carlos ; Varghese, Shinto; Yoon, Seong-Jun; Park, Soo Young; Gierschner, Johannes; Gnecco, Enrico; Pina, Carlos M.
KeywordsFriction force microscopy
High resolution
Aqueous conditions
Organic semiconductor crystals
Issue Date2-Mar-2016
PublisherAmerican Chemical Society
CitationJournal of Physics: Condensed Matter, 28 (13): 134002 (2016)
AbstractOrganic semiconductors (OSC) are attracting much interest for (opto)electronic applications, such as photovoltaics, LEDs, sensors or solid state lasers. In particular, crystals formed by small $\pi $ -conjugated molecules have shown to be suitable for constructing OSC devices. However, the (opto)electronic properties are complex since they depend strongly on both the mutual orientation of molecules as well as the perfection of bulk crystal surfaces. Hence, there is an urgent need to control nano-topographic OSC features in real space. Here we show that friction force microscopy in water is a very suitable technique to image the free surface morphology of an OSC single crystal (TDDCS) with sub-nanometer resolution. We demonstrate the power of the method by direct correlation to the structural information extracted from combined single crystal (SC-) and specular (s-) XRD studies, which allows us to identify the pinning centers encountered in the stick-slip motion of the probing tip with the topmost methyl groups on the TDDCS surface.
Publisher version (URL)http://dx.doi.org/10.1088/0953-8984/28/13/134002
Appears in Collections:(IGEO) Artículos
Show full item record
Review this work

Related articles:

WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.