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Exploring single semiconductor nanowires with a multimodal hard X-ray nanoprobe

AutorMartínez-Criado, Gema; Segura-Ruiz, Jaime; Alén, Benito ; Eymery, Joël; Rogolev, Andrei; Tucoulou, Rémi; Homs, Alejandro
Fecha de publicación10-dic-2014
CitaciónAdvanced Materials 26(46): 7873-7879 (2014)
Resumen© 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. Semiconductor nanowires offer new opportunities for optoelectronic and spintronic nanodevices. However, their full potential is ultimately dictated by our ability to control multiple property-function relationships taking place at the nanoscale in the spatial and time domains. Only a combination of highresolution analytical techniques can provide a comprehensive understanding of their complex functionalities. Here we describe how a multimodal hard X-ray nanoprobe addresses fundamental questions in nanowire research. Selected topics ranging from cluster formation, dopant segregation, and phase separations to quantum confi nement effects are investigated with sub- 100 nm spatial resolution and sub-50 ps temporal resolution. This approach opens new avenues for structural, composition and optical studies with broad applicability in materials science.
Versión del editorhttp://dx.doi.org/10.1002/adma.201304345
Identificadorese-issn: 1521-4095
issn: 0935-9648
Aparece en las colecciones: (IMN-CNM) Artículos
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