English   español  
Por favor, use este identificador para citar o enlazar a este item: http://hdl.handle.net/10261/131808
COMPARTIR / IMPACTO:
Estadísticas
logo share SHARE logo core CORE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:
Título

Procedures and practices for evaluating thin-film solar cell stability

AutorRoesch, Roland; Faber, Tobias; Hauff, Elizabeth von; Brown, Thomas M.; Lira-Cantú, Mónica ; Hoppe, Harald
Palabras claveBurn-in
Stability testing protocols
Thin-film solar cells
Operational stability
long-term degradation
Fecha de publicación2015
EditorWiley-VCH
CitaciónAdvanced Energy Materials 5(20): 1501407 (2015)
ResumenDuring the last few decades, and in some cases only the last few years, novel thin-film photovoltaic (PV) technologies such as dye-sensitized solar cells (DSSC), organic solar cells (OPV), and, more recently, perovskite-based solar cells (PSC) have been growing in maturity with respect to device performance and device stability. Together with new material systems, novel device architectures have also been introduced. Both parameters will have an effect on the overall device stability. In order to improve the understanding of degradation effects and how they can be prevented, stress testing under different conditions is commonly applied. By careful combination of stress factors and thorough analysis of photovoltaic parameter decaying curves, an understanding of the underlying degradation pathways can be gained. With the help of standardized and accelerated stress tests, as described in the ISOS-protocols, statements concerning application lifetimes can finally be made and compared among different labs. Once a photovoltaic technology has proven long lasting durability, the ultimate barrier for entering the commercial market are the IEC tests, taking a deeper look on overall safety and reliability, not only on durability. Here, the most prominent stress tests are reviewed, discussed and extended with respect to learning the most about photovoltaic device stability.
URIhttp://hdl.handle.net/10261/131808
DOI10.1002/aenm.201501407
Identificadoresdoi: 10.1002/aenm.201501407
issn: 1614-6832
e-issn: 1614-6840
Aparece en las colecciones: (CIN2) Artículos
Ficheros en este ítem:
Fichero Descripción Tamaño Formato  
accesoRestringido.pdf15,38 kBAdobe PDFVista previa
Visualizar/Abrir
Mostrar el registro completo
 


NOTA: Los ítems de Digital.CSIC están protegidos por copyright, con todos los derechos reservados, a menos que se indique lo contrario.