Dielectric relaxation in YMnO3 single crystals

Abstract

We have investigated the origin of the dielectric relaxation in YMnO3 single crystals. Two distinct dielectric relaxation features were observed at low (200 < T < 373 K) and high (300 < T < 450 K) temperatures. Analysis of our detailed frequency, electrode and thickness dependent dielectric measurements and ac conductivity data as well as the use of single crystals allow us to get a comprehensive picture of these relaxations. The low temperature relaxation is attributed to the Maxwell–Wagner type effects originating from the dipoles at the surface while the high temperature one is suggested to originate from hopping of charge carriers resulting from the second ionization of oxygen vacancies.