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Mechanical response to swift ion irradiation-induced nano-tracks in silica

AutorPáramo, Á.R.; Sordo, F.; Garoz, D.; Peña Rodríguez, Ovidio ; Prada, A.; Olivares Villegas, José ; Crespillo, M.L. ; Perlado, J.M.; Rivera, A.
Palabras claveSilica refractive index
Bromine tracks
FEM
Silica ion irradiation
Fecha de publicación13-ene-2015
EditorElsevier
CitaciónNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 352: 145-147 (2015)
Resumen© 2015 Elsevier B.V. Ion irradiation on dielectric materials produces several processes, such ionization and defect formation followed by a decay governed by thermal processes such as heat diffusion and atomic rearrangement. Finally in the irradiated region the mechanical properties are altered, strain and stress fields appear, a densification takes places and other properties such as the refractive index are affected. In order to simulate the mechanical response of silica to swift ion irradiation we use a methodology based on molecular dynamics (MD) and finite element methods (FEM). We use information from MD to obtain the local densification generated by an incoming swift ion. Finally we calculate the densification in the ion track using FEM. This method provides information on the strain and stress field along the material as a function of ion irradiation fluence. For this work an experimental campaign using Br ions from 5 to 50 MeV has been done at CMAM accelerator (Madrid). We measured the refractive index and we observe that for high fluences the refractive index decreases. The effect of the strain field on the density could explain the decrease in the refractive index. We check this hypothesis using our methodology coupling MD and FEM.
Descripción3 págs.; 5 figs.; Proceedings of the 12th International Conference on Computer Simulation of Radiation Effects in Solids, Alacant, Spain, 8-13 June, 2014
Versión del editorhttp://dx.doi.org/10.1016/j.nimb.2014.12.073
URIhttp://hdl.handle.net/10261/130838
DOI10.1016/j.nimb.2014.12.073
Identificadoresdoi: 10.1016/j.nimb.2014.12.073
issn: 0168-583X
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