English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/130334
Share/Impact:
Statistics
logo share SHARE logo core CORE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:
Title

Nanomechanical properties of solvent cast polystyrene and poly(methyl methacrylate) polymer blends and self-assembled block copolymers

AuthorsLorenzoni, Matteo; Evangelio, Laura; Nicolet, Célia; Navarro, Christophe; San Paulo, Álvaro ; Rius, Gemma; Perez Murano, Francesc X.
Issue Date11-Sep-2015
PublisherThe International Society for Optics and Photonics
CitationJournal of Micro/Nanolithography, MEMS, and MOEMS 14(3): 033509 (2015)
Abstract© 2015 Society of Photo-Optical Instrumentation Engineers (SPIE). The nanomechanical properties of solvent-cast polymer thin films have been investigated using PeakForce™ Quantitative Nanomechanical Mapping. The samples consisted of films of polystyrene (PS) and poly(methyl methacrylate) (PMMA) obtained after the dewetting of toluene solution on a polymeric brush layer. Additionally, we have probed the mechanical properties of poly(styrene-b-methyl methacrylate) block copolymers (BCP) as randomly oriented thin films. The probed films have a critical thickness <50 nm and present features to be resolved <42 nm. The Young's modulus values obtained through several nanoindentation experiments present a good agreement with previous literature, suggesting that the PeakForce™ technique could be crucial for BCP investigations, e.g., as a predictor of the mechanical stability of the different phases.
Publisher version (URL)http://dx.doi.org/10.1117/1.JMM.14.3.033509
URIhttp://hdl.handle.net/10261/130334
DOI10.1117/1.JMM.14.3.033509
Identifierse-issn: 1932-5134
issn: 1932-5150
Appears in Collections:(IMB-CNM) Artículos
(IMN-CNM) Artículos
Files in This Item:
File Description SizeFormat 
nanomechanical_properties_Lorenzoni.pdf1,81 MBAdobe PDFThumbnail
View/Open
Show full item record
Review this work
 

Related articles:


WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.