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Título

Incorporation of Sb in InAs/GaAs quantum dots

AutorMolina, Sergio I.; Sánchez, A. M.; Beltrán, A. M.; Sales, David L.; Ben, Teresa; Chisholm, M. F.; Varela, María; Pennycook, Stephen J.; Galindo, P. L.; Papworth, A. J.; Goodhew, P. J.; Ripalda, José María CSIC ORCID
Palabras claveQuantum dots
Cobalt alloys
elemental semiconductors
Scanning tunnelling microscopy
self-assembly
Silicon alloys
Silicon
surface reconstruction
Fecha de publicación27-dic-2007
EditorAmerican Institute of Physics
CitaciónApplied Physics Letters 91, 263105 (2007)
ResumenReactive epitaxy of Co on vicinal Si(111) surfaces is found to be a flexible and a convenient method for the preparation of dense arrays of Co silicide quantum dots. In the present work, submonolayer amounts of Co were deposited at 800 K on vicinal and flat Si surfaces, analyzing the resulting structures by scanning tunneling microscopy. On vicinal Si(111) surfaces with relatively narrow (~40–100 Å) terrace width, such reactive epitaxy leads to self-assembled arrays of CoSi2 quantum dots with a sharp size distribution function. In contrast, the growth of Co on flat Si(111) results in an inhomogeneous array of dots mixed with a variety of silicide phases
Versión del editorhttp://dx.doi.org/10.1063/1.2826546
http://link.aip.org/link
URIhttp://hdl.handle.net/10261/11936
DOI10.1063/1.2826546
ISSN0003-6951
Aparece en las colecciones: (IMN-CNM) Artículos

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