English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/118154
Share/Impact:
Statistics
logo share SHARE logo core CORE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:

Title

Anisotropy and inhomogeneity measurement of the transport properties of spark plasma sintered thermoelectric materials

AuthorsJacquot, Alexandre; Rull Bravo, Marta ; Moure Arroyo, Alberto ; Fernández Lozano, José Francisco ; Martín-González, Marisol; Saleemi, Mohsin; Toprak, Muhammet; Muhammed, Mamoun; Bartel, M.; Jaegle, M.
KeywordsSintering
Thermoelectric
Electrical properties
Issue Date2013
PublisherCambridge University Press
CitationMRS Proceedings 1490: 89-95 (2013)
AbstractWe report on the development and capabilities of two new measurement systems developed at Fraunhofer-IPM. The first measurement system is based on an extension of the Van der Pauw method and is suitable for cube-shaped samples. A mapping of the electrical conductivity tensor of a Skutterudite-SPS samples produced at the Instituto de Microelectrónica de Madrid is presented. The second measurement system is a ZTmeter also developed at the Fraunhofer-IPM. It enables the simultaneous measurement of the electrical conductivity, Seebeck coefficient and thermal conductivity up to 900 K of cubes at least 5x5x5 mm3 in size. The capacity of this measurement system for measuring the anisotropy of the transport properties of a (Bi,Sb)2Te3SPS sample produced by KTH is demonstrated by simply rotating the samples.
Publisher version (URL)http://dx.doi.org/10.1557/opl.2012.1670
URIhttp://hdl.handle.net/10261/118154
DOI10.1557/opl.2012.1670
Identifiersdoi: 10.1557/opl.2012.1670
issn: 1946-4274
Appears in Collections:(IMN-CNM) Artículos
Files in This Item:
File Description SizeFormat 
anisotropy_inhomogeneity_Jacquot.pdf2,27 MBAdobe PDFThumbnail
View/Open
Show full item record
Review this work
 


WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.