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Title

Advanced atomic force microscopy techniques

AuthorsGlatzel, Thilo; Hölscher, Hendrik; Schimmel, Thomas; Baykara, Mehmet Z.; Schwarz, U.; García García, Ricardo
Issue Date21-Dec-2012
PublisherBeilstein-Institut für Literatur der Organischen Chemie
CitationBeilstein Journal of Organic Chemistry 3: 893-894 (2012)
AbstractAlthough its conceptual approach is as simple as the technique used in record players already introduced in the 19th century, the invention of the atomic force microscope (AFM) in 1986 by Binnig, Quate, and Gerber was a milestone for nanotechnology. The scanning tunneling microscope (STM), introduced some years earlier, had already achieved atomic resolution, but is limited to conductive surfaces. Since its operational principle is based on the detection of the forces acting between tip and sample, this restriction does not exist for the AFM. Consequently, atomic force microscopy quickly became the standard tool for nanometer-scale imaging of all types of surfaces in all environments. True atomic resolution was first achieved in the 1990s. The most convincing results, however, were restricted to the so-called noncontact mode in vacuum for a long time, but recent technical developments overcame this limitation, and atomic-resolution imaging is now also a standard in liquids.
DescriptionThis article is part of the Thematic Series "Advanced atomic force microscopy techniques".
Publisher version (URL)http://dx.doi.org/10.3762/bjnano.3.99
URIhttp://hdl.handle.net/10261/117946
DOI10.3762/bjnano.3.99
Identifiersdoi: 10.3762/bjnano.3.99
issn: 2190-4286
Appears in Collections:(IMN-CNM) Artículos
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