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Title: | Effect of reactive ion beam etching on the photoluminescence of CdTe epitaxial layers |
Authors: | Martínez Pastor, Juan Pascual; Fuster, David CSIC ORCID ; Abellán Rubio, María de los Ángeles CSIC; Anguita, José Virgilio CSIC; Sochinskii, N. V. | Keywords: | Cadmium compounds Etching II-VI semiconductors Impurities Ion beam assisted deposition MOCVD Photoluminescence Sapphire Semiconductor epitaxial layers Spectral line intensity Vapour phase epitaxial growth |
Issue Date: | 10-Mar-2008 | Publisher: | American Institute of Physics | Citation: | Journal of Applied Physics 103, 056108 (2008) | Abstract: | We demonstrated the effect of reactive ion beam etching (RIBE) process on the PL properties of CdTe/sapphire metal organic vapor phase epitaxy layers. At optimum conditions, the RIBE attack does not make significant morphological changes but it results in an increase of the concentration of acceptor impurities. This was revealed by an increase of the overall photoluminescence (PL) intensity and, simultaneously, a decrease of the PL decay time, more important on the low energy side of PL spectrum due to the recombination of carriers in acceptor pairs. | Description: | http://link.aip.org/link/?JAPIAU/103/056108/1 | Publisher version (URL): | http://dx.doi.org/10.1063/1.2874480 | URI: | http://hdl.handle.net/10261/11694 | DOI: | 10.1063/1.2874480 | ISSN: | 0021-8979 |
Appears in Collections: | (IMN-CNM) Artículos |
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