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"Multidimensional reflectometry for industry" (xD-Reflect) an European research project

AutorHöpe, Andreas; Koo, Annette; Martínez Verdú, Francisco; Leloup, Frédéric B.; Obein, Gaël; Wübbeler, Gerd; Campos Acosta, Joaquín ; Iacomussi, Paola; Jaanson, P.; Källberg, S.; Smidk, Marek
Fecha de publicación24-feb-2014
EditorSociety of Photo-Optical Instrumentation Engineers
CitaciónProceedings of SPIE - The International Society for Optical Engineering 9018: 901804 (2014)
ResumenThe European Metrology Research Program (EMRP) is a metrology-focused program of coordinated Research and Development (RD) funded by the European Commission and participating countries within the European Association of National Metrology Institutes (EURAMET). It supports and ensures research collaboration between them by launching and managing different types of project calls. Within the EMRP Call 2012 >Metrology for Industry>, the joint research project (JRP) entitled >Multidimensional Reflectometry for Industry> (xD-Reflect) was submitted by a consortium of 8 National Metrology Institutes (NMIs) and 2 universities and was subsequently funded. The general objective of xD-Reflect is to meet the demands from industry to describe the overall macroscopic appearance of modern surfaces by developing and improving methods for optical measurements which correlate with the visual sensation being evoked. In particular, the project deals with the >Goniochromatism>, >Gloss> and >Fluorescence> properties of dedicated artifacts, which will be investigated in three main work packages (WP). Two additional transversal WP reinforce the structure: >Modelling and Data Analysis> with the objective to give an irreducible set of calibration schemes and handling methods and >Visual Perception>, which will produce perception scales for the different visual attributes. Multidimensional reflectometry involves the enhancement of spectral and spatial resolution of reference gonioreflectometers for BRDF measurements using modern detectors, conoscopic optical designs, CCD cameras, line scan cameras, and modern light sources in order to describe new effects like sparkle and graininess/coarseness. More information and updated news concerning the project can be found on the xD-Reflect website http://www.xdreflect.eu/.
Descripción11 pags.
Versión del editorhttp://dx.doi.org/10.1117/12.2035981
Identificadoresdoi: 10.1117/12.2035981
issn: 0277-786X
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