English   español  
Por favor, use este identificador para citar o enlazar a este item: http://hdl.handle.net/10261/114910
Compartir / Impacto:
Estadísticas
Add this article to your Mendeley library MendeleyBASE
Citado 4 veces en Web of Knowledge®  |  Ver citas en Google académico
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar otros formatos: Exportar EndNote (RIS)Exportar EndNote (RIS)Exportar EndNote (RIS)
Título

"Multidimensional reflectometry for industry" (xD-Reflect) an European research project

Autor Höpe, Andreas; Koo, Annette; Martínez Verdú, Francisco; Leloup, Frédéric B.; Obein, Gaël; Wübbeler, Gerd; Campos Acosta, Joaquín ; Iacomussi, Paola; Jaanson, P.; Källberg, S.; Smidk, Marek
Fecha de publicación 24-feb-2014
EditorSociety of Photo-Optical Instrumentation Engineers
Citación Proceedings of SPIE - The International Society for Optical Engineering 9018: 901804 (2014)
ResumenThe European Metrology Research Program (EMRP) is a metrology-focused program of coordinated Research and Development (RD) funded by the European Commission and participating countries within the European Association of National Metrology Institutes (EURAMET). It supports and ensures research collaboration between them by launching and managing different types of project calls. Within the EMRP Call 2012 >Metrology for Industry>, the joint research project (JRP) entitled >Multidimensional Reflectometry for Industry> (xD-Reflect) was submitted by a consortium of 8 National Metrology Institutes (NMIs) and 2 universities and was subsequently funded. The general objective of xD-Reflect is to meet the demands from industry to describe the overall macroscopic appearance of modern surfaces by developing and improving methods for optical measurements which correlate with the visual sensation being evoked. In particular, the project deals with the >Goniochromatism>, >Gloss> and >Fluorescence> properties of dedicated artifacts, which will be investigated in three main work packages (WP). Two additional transversal WP reinforce the structure: >Modelling and Data Analysis> with the objective to give an irreducible set of calibration schemes and handling methods and >Visual Perception>, which will produce perception scales for the different visual attributes. Multidimensional reflectometry involves the enhancement of spectral and spatial resolution of reference gonioreflectometers for BRDF measurements using modern detectors, conoscopic optical designs, CCD cameras, line scan cameras, and modern light sources in order to describe new effects like sparkle and graininess/coarseness. More information and updated news concerning the project can be found on the xD-Reflect website http://www.xdreflect.eu/.
Descripción 11 pags.
Versión del editorhttp://dx.doi.org/10.1117/12.2035981
URI http://hdl.handle.net/10261/114910
DOI10.1117/12.2035981
Identificadoresdoi: 10.1117/12.2035981
issn: 0277-786X
Aparece en las colecciones: (CFMAC-IO) Artículos
Ficheros en este ítem:
Fichero Descripción Tamaño Formato  
accesoRestringido.pdf15,38 kBAdobe PDFVista previa
Visualizar/Abrir
Mostrar el registro completo
 



NOTA: Los ítems de Digital.CSIC están protegidos por copyright, con todos los derechos reservados, a menos que se indique lo contrario.