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Multidimensional reflectometry for industry (xD-Reflect) an European research project

AutorHöpe, Andreas; Koo, Annette; Martínez Verdú, Francisco; Leloup, Frédéric; Obeine, Gaël; Wübbelerf, Gerd; Campos Acosta, Joaquín ; Iacomussi, Paola; Jaason, Priit, Kälberg, Stefan; Smidk, Marek
Palabras claveSparkle
Graininess
Visual perception
Modelling and Data analysis
Fluorescence
Goniochromatism
Gloss
Fecha de publicación3-feb-2014
EditorSociety of Photo-Optical Instrumentation Engineers
CitaciónIS&T/SPIE Electronic Imaging Science and Technology (2014)
ResumenThe European Metrology Research Program (EMRP) is a metrology-focused program of coordinated Research & Development (R&D) funded by the European Commission and participating countries within the European Association of National Metrology Institutes (EURAMET). It supports and ensures research collaboration between them by launching and managing different types of project calls. Within the EMRP Call 2012 >Metrology for Industry>, the joint research project (JRP) entitled >Multidimensional Reflectometry for Industry> (xD-Reflect) was submitted by a consortium of 8 National Metrology Institutes (NMIs) and 2 universities and was subsequently funded. The general objective of xD-Reflect is to meet the demands from industry to describe the overall macroscopic appearance of modern surfaces by developing and improving methods for optical measurements which correlate with the visual sensation being evoked. In particular, the project deals with the >Goniochromatism>, >Gloss> and >Fluorescence> properties of dedicated artifacts, which will be investigated in three main work packages (WP). Two additional transversal WP reinforce the structure: >Modelling and Data Analysis> with the objective to give an irreducible set of calibration schemes and handling methods and >Visual Perception>, which will produce perception scales for the different visual attributes. Multidimensional reflectometry involves the enhancement of spectral and spatial resolution of reference gonioreflectometers for BRDF measurements using modern detectors, conoscopic optical designs, CCD cameras, line scan cameras, and modern light sources in order to describe new effects like sparkle and graininess/coarseness.
DescripciónElectronic imaging science and technology, measuring,modeling and reproducing material appearance, Francisco, California (USA), 2-6 February 2014. http://spie.org/x105078.xml
URIhttp://hdl.handle.net/10261/114824
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