English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/114416
Share/Impact:
Statistics
logo share SHARE logo core CORE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:
Title

Application of atomic force microscopy to the study of glass decay

AuthorsGarcía Heras, Manuel ; Carmona, N. ; Ruiz-Conde, Antonio; Sánchez-Soto, P.; Benítez, J.J.
KeywordsMicroscopy
Weathering
Chemical resistance
Decay
Glass
Issue Date2005
PublisherElsevier
CitationMaterials Characterization 55: 272-280 (2005)
AbstractConventional methods such as scanning electron microscopy with energy dispersive X-ray spectrometry are commonly used to characterize corroded glasses. However, their use is often restricted when glass pieces come from historical artworks and may not be damaged. Atomic force microscopy can be an alternative method for characterizing such glasses since it is an essentially non-destructive technique which allows their topographic analysis with good vertical and lateral resolutions. In addition, samples do not require any previous manipulation. The application of atomic force microscopy to study glass decay is reported in this paper. The main goals of the research were to study the corroded texture of both historical glass pieces and model glasses weathered in the laboratory, and to determine and compare the chemical corrosion mechanisms which occurred in both cases. The resulting data suggest that atomic force microscopy can be a useful technique for characterizing decay mechanisms in historical glasses. © 2005 Elsevier Inc. All rights reserved.
URIhttp://hdl.handle.net/10261/114416
DOI10.1016/j.matchar.2005.07.001
Identifiersdoi: 10.1016/j.matchar.2005.07.001
issn: 1044-5803
Appears in Collections:(CENIM) Artículos
Files in This Item:
File Description SizeFormat 
accesoRestringido.pdf15,38 kBAdobe PDFThumbnail
View/Open
Show full item record
 

Related articles:


WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.