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xD-Reflect - >Multidimensional Reflectometry for Industry> a research project of the European Metrology Research Program (EMRP)

AuthorsHope, A.; Koo, A.; Forthmann, C.; Verdú, F.M.; Campos Acosta, Joaquín CSIC ORCID ; Källberg, S.
Issue Date24-Jun-2014
CitationNew Developments and Applications in Optical Radiometry, NEWRAD (2014)
AbstractThe general objective of the xD-Reflect research project is to meet the demands from European industry to measure the overall macroscopic appearance of modern surfaces by developing and improving methods for optical measurements which correlate with the visual sensation being evoked. In particular, the project deals with different attributes of dedicated artefacts, like >Goniochromatism>, >Gloss> and >Fluorescence> properties, which will be investigated in three main work packages. Two additional transversal work packages reinforce the structure: >Modelling and Data Analysis> with the objective to give an irreducible set of calibration schemes and handling methods and >Visual Perception>, which will produce perception scales for the different visual attributes.
DescriptionAndreas Hope et al.; 12th International Conference, Otaniemi, Espoo, Helsinki (Finland), 24-27 June, 2014; http://newrad2014.aalto.fi/
Appears in Collections:(CFMAC-IO) Comunicaciones congresos
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