English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/111795
Share/Impact:
Statistics
logo share SHARE   Add this article to your Mendeley library MendeleyBASE
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL | DATACITE
Exportar a otros formatos:

Title

xD-Reflect - >Multidimensional Reflectometry for Industry> a research project of the European Metrology Research Program (EMRP)

AuthorsHope, A.; Koo, A.; Forthmann, C.; Verdú, F.M.; Campos Acosta, Joaquín CSIC ORCID ; Källberg, S.
Issue Date24-Jun-2014
CitationNew Developments and Applications in Optical Radiometry, NEWRAD (2014)
AbstractThe general objective of the xD-Reflect research project is to meet the demands from European industry to measure the overall macroscopic appearance of modern surfaces by developing and improving methods for optical measurements which correlate with the visual sensation being evoked. In particular, the project deals with different attributes of dedicated artefacts, like >Goniochromatism>, >Gloss> and >Fluorescence> properties, which will be investigated in three main work packages. Two additional transversal work packages reinforce the structure: >Modelling and Data Analysis> with the objective to give an irreducible set of calibration schemes and handling methods and >Visual Perception>, which will produce perception scales for the different visual attributes.
DescriptionAndreas Hope et al.; 12th International Conference, Otaniemi, Espoo, Helsinki (Finland), 24-27 June, 2014; http://newrad2014.aalto.fi/
URIhttp://hdl.handle.net/10261/111795
Appears in Collections:(CFMAC-IO) Comunicaciones congresos
Files in This Item:
File Description SizeFormat 
xD-Reflect.pdf751,22 kBUnknownView/Open
Show full item record
Review this work
 


WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.