Lumped Element Model for Arbitrarily Shaped Integrated Inductors - A Statistical Analysis

Abstract

In this paper a model based in lumped elements is presented for the characterization of integrated inductors. The model allows the modelling of integrated inductors for a wide range of frequencies and different inductor topologies, thus granting the evaluation of important design parameters such as inductance, quality factor and self-resonance frequency. The model will be explained in detail and compared against electromagnetic simulations for a 0.35-μm and 0.13-μm CMOS technologies. Results for square and octagonal geometries are presented. A statistic analysis is also presented for the octagonal topology in order to validate the model over a wide range of geometric variables in 0.35-μm CMOS technology.