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Lumped Element Model for Arbitrarily Shaped Integrated Inductors - A Statistical Analysis

AuthorsPassos, F.; Fino, M.H.; Roca, Elisenda ; Gonzalez-Echevarria, R.; Fernández, Francisco V.
Issue Date2013
PublisherInstitute of Electrical and Electronics Engineers
CitationIEEE International Conference on Microwaves, Communication, Antennas and Electronic Systems (COMCAS): 1-5 (2013)
AbstractIn this paper a model based in lumped elements is presented for the characterization of integrated inductors. The model allows the modelling of integrated inductors for a wide range of frequencies and different inductor topologies, thus granting the evaluation of important design parameters such as inductance, quality factor and self-resonance frequency. The model will be explained in detail and compared against electromagnetic simulations for a 0.35-μm and 0.13-μm CMOS technologies. Results for square and octagonal geometries are presented. A statistic analysis is also presented for the octagonal topology in order to validate the model over a wide range of geometric variables in 0.35-μm CMOS technology.
Identifiersdoi: 10.1109/COMCAS.2013.6685307
Appears in Collections:(IMSE-CNM) Comunicaciones congresos
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