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Four-Point Resistance of Individual Single-Wall Carbon Nanotubes

AuthorsGao, B.; Chen, Y. F.; Fuhrer, M. S.; Glattli, D. C.; Bachtold, Adrian
Keywords[PACS] Nanotubes
[PACS] Relaxation times and mean free paths
[PACS] Fullerenes and related materials
[PACS] Electronic transport in mesoscopic systems
Issue Date31-Oct-2005
PublisherAmerican Physical Society
CitationPhysical Review Letters 95(19): 196802 (2005)
AbstractWe have studied the resistance of single-wall carbon nanotubes measured in a four-point configuration with noninvasive voltage electrodes. The voltage drop is detected using multiwalled carbon nanotubes while the current is injected through nanofabricated Au electrodes. The resistance at room temperature is shown to be linear with the length as expected for a classical resistor. This changes at cryogenic temperature; the four-point resistance then depends on the resistance at the Au-tube interfaces and can even become negative due to quantum-interference effects.
Description4 pages, 5 figures.-- PACS nrs.: 73.63.Fg, 72.15.Lh, 72.80.Rj, 73.23.−b.-- ArXiv pre-print available at: http://arxiv.org/abs/cond-mat/0505041
Publisher version (URL)http://dx.doi.org/10.1103/PhysRevLett.95.196802
Appears in Collections:(CIN2) Artículos
(IMB-CNM) Artículos
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