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Current-induced cleaning of graphene

AuthorsMoser, Joel ; Barreiro, Amelia ; Bachtold, Adrian
Quantum Hall effect
Surface cleaning
Surface contamination
Issue Date19-Oct-2007
PublisherAmerican Institute of Physics
CitationApplied Physics Letters 91, 163513 (2007)
AbstractA simple yet highly reproducible method to suppress contamination of graphene at low temperature inside the cryostat is presented. The method consists of applying a current of several milliamperes through the graphene device, which is here typically a few microns wide. This ultrahigh current density is shown to remove contamination adsorbed on the surface. This method is well suited for quantum electron transport studies of undoped graphene devices, and its utility is demonstrated here by measuring the anomalous quantum Hall effect.
Description3 pages, 4 figures.-- PACS nrs.: 81.05.Uw, 81.65.Cf, 68.35.Dv, 68.43.Mn, 73.43.Fj.-- ArXiv pre-print available at: http://arxiv.org/abs/0709.0607
Publisher version (URL)http://dx.doi.org/10.1063/1.2789673
Appears in Collections:(CIN2) Artículos
(IMB-CNM) Artículos
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