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Dielectric spectroscopy at the nanoscale by atomic force microscopy: A simple model linking materials properties and experimental response

AutorMiccio, Luis A.; Kummali, Mohammed M.; Schwartz, G. A. ; Alegría, Ángel ; Colmenero de León, Juan
Fecha de publicación2014
EditorAmerican Institute of Physics
CitaciónJournal of Applied Physics 115(18): 184305 (2014)
ResumenThe use of an atomic force microscope for studying molecular dynamics through dielectric spectroscopy with spatial resolution in the nanometer scale is a recently developed approach. However, difficulties in the quantitative connection of the obtained data and the material dielectric properties, namely, frequency dependent dielectric permittivity, have limited its application. In this work, we develop a simple electrical model based on physically meaningful parameters to connect the atomic force microscopy (AFM) based dielectric spectroscopy experimental results with the material dielectric properties. We have tested the accuracy of the model and analyzed the relevance of the forces arising from the electrical interaction with the AFM probe cantilever. In this way, by using this model, it is now possible to obtain quantitative information of the local dielectric material properties in a broad frequency range. Furthermore, it is also possible to determine the experimental setup providing the best sensitivity in the detected signal. © 2014 AIP Publishing LLC.
Versión del editorhttp://dx.doi.org/10.1063/1.4875836
URIhttp://hdl.handle.net/10261/102603
DOI10.1063/1.4875836
Identificadoresdoi: 10.1063/1.4875836
e-issn: 1089-7550
issn: 0021-8979
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