English   español  
Por favor, use este identificador para citar o enlazar a este item: http://hdl.handle.net/10261/101949
COMPARTIR / IMPACTO:
Estadísticas
logo share SHARE logo core CORE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:
Título

Nanoparticle movement: Plasmonic forces and physical constraints

AutorBatson, Philip E.; Reyes-Coronado, Alejandro; Barrera, Rubén G.; Rivacoba, Alberto ; Echenique, Pedro M. ; Aizpurua, Javier
Palabras clavePlasmonic forces
Aberration-corrected microscopy
STEM
Nanoparticle structure
Van der Waals forces
Keesom forces
Fecha de publicación2012
EditorElsevier
CitaciónUltramicroscopy 123: 50-58 (2012)
ResumenNanoparticle structures observed in aberration-corrected electron microscopes exhibit many types of behavior, some of which are dominated by intrinsic conditions, unrelated to the microscope environment. Some behaviors are clearly driven by the electron beam, however, and the question arises as to whether these are similar to intrinsic mechanisms, useful for understanding nanoscale behavior, or whether they should be regarded as unwanted modification of as-built specimens. We have studied a particular kind of beam-specimen interaction - plasmon dielectric forces caused by the electric fields imposed by a passing swift electron - identifying four types of forced motion, including both attractive and repulsive forces on single nanoparticles, and coalescent and non-coalescent forces in groups of two or more nanoparticles. We suggest that these forces might be useful for deliberate electron beam guided movement of nanoparticles.
Versión del editorhttp://dx.doi.org/10.1016/j.ultramic.2012.05.004
URIhttp://hdl.handle.net/10261/101949
DOI10.1016/j.ultramic.2012.05.004
ISSN0304-3991
E-ISSN1879-2723
Aparece en las colecciones: (CFM) Artículos
Ficheros en este ítem:
Fichero Descripción Tamaño Formato  
accesoRestringido.pdf15,38 kBAdobe PDFVista previa
Visualizar/Abrir
Mostrar el registro completo
 


NOTA: Los ítems de Digital.CSIC están protegidos por copyright, con todos los derechos reservados, a menos que se indique lo contrario.