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Título

A general perspective of the characterization and quantification of nanoparticles: Imaging, spectroscopic, and separation techniques

Autor Lapresta-Fernández, A. ; Salinas-Castillo, A.; Anderson de la LLana, S.; Costa-Fernández, J.M.; Domínguez-Meister, Santiago ; Cecchini, R. ; Capitán-Vallvey, L. F.; Moreno-Bondi, M.C.; Marco, María Pilar; Sánchez-López, J.C. ; Anderson, I.S.
Fecha de publicación 2014
EditorTaylor & Francis
Citación Critical Reviews in Solid State and Materials Sciences 39: 423- 458 (2014)
ResumenThis article gives an overview of the different techniques used to identify, characterize, and quantify engineered nanoparticles (ENPs). The state-of-the-art of the field is summarized, and the different characterization techniques have been grouped according to the information they can provide. In addition, some selected applications are highlighted for each technique. The classification of the techniques has been carried out according to the main physical and chemical properties of the nanoparticles such as morphology, size, polydispersity characteristics, structural information, and elemental composition. Microscopy techniques including optical, electron and X-ray microscopy, and separation techniques with and without hyphenated detection systems are discussed. For each of these groups, a brief description of the techniques, specific features, and concepts, as well as several examples, are described. © 2014 Taylor and Francis Group, LLC.
URI http://hdl.handle.net/10261/101939
DOI10.1080/10408436.2014.899890
Identificadoresdoi: 10.1080/10408436.2014.899890
issn: 1547-6561
Aparece en las colecciones: (ICMS) Artículos
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