2024-03-29T11:07:09Zhttp://digital.csic.es/dspace-oai/requestoai:digital.csic.es:10261/1355682016-08-22T07:24:58Zcom_10261_98com_10261_3col_10261_351
Local charge measurement using off-axis electron holography
Beleggia, M.
Gontard, Lionel C.
Dunin-Borkowski, Rafal E.
Electron holography,
Electrostatics,
Dielectric nanoparticles
Charge measurement
Electrostatic potential
A model-independent approach based on Gauss’ theorem for measuring the local charge in a
specimen from an electron-optical phase image recorded using off-axis electron holography
was recently proposed. Here, we show that such a charge measurement is reliable when it
is applied to determine the total charge enclosed within an object. However, the situation is
more complicated for a partial charge measurement when the integration domain encloses
only part of the object. We analyze in detail the effects on charge measurement of the mean
inner potential of the object, of the presence of induced charges on nearby supports/electrodes
and of noise. We perform calculations for spherical particles and highlight the differences
when dealing with other object shapes. Our analysis is tested using numerical simulations and
applied to the interpretation of an experimental dataset recorded from a sapphire particle
2016-08-17T06:45:26Z
2016-08-17T06:45:26Z
2016
artículo
Journal of Physics D: Applied Physics, 49 (2016) 294003
http://hdl.handle.net/10261/135568
10.1088/0022-3727/49/29/294003
eng
Publisher's version
http://dx.doi.org/10.1088/0022-3727/49/29/294003
Sí
http://creativecommons.org/licenses/by-nc-nd/4.0/
openAccess
Institute of Physics Publishing