2024-03-28T22:48:36Zhttp://digital.csic.es/dspace-oai/requestoai:digital.csic.es:10261/1151652019-11-20T11:10:51Zcom_10261_90com_10261_4col_10261_343
A Procedure for Alternate Test Feature Design and Selection
Barragán, Manuel J.
Leger, Gildas
his paper is a practical illustration of the adoption of alternate tests based upon the judicious selection of the set of parameters to be considered for design as well as to be observed subsequently. The notion of signatures is introduced, and their ability to predict design accuracy is analyzed. The application is demonstrated for an RF LNA circuit.
2015-05-14T07:13:50Z
2015-05-14T07:13:50Z
2015
artículo
IEEE Design and Test, 32(1): 18-25 (2015(
http://hdl.handle.net/10261/115165
10.1109/MDAT.2014.2361722
eng
Postprint
http://dx.doi.org/10.1109/MDAT.2014.2361722
Sí
openAccess
Institute of Electrical and Electronics Engineers