2024-03-29T15:09:26Zhttp://digital.csic.es/dspace-oai/requestoai:digital.csic.es:10261/1274022019-06-11T07:25:05Zcom_10261_106com_10261_4col_10261_1241
Sensor-fault tolerance using robust MPC with set-based state estimation and active fault isolation
Xu, Feng
Puig, Vicenç
Ocampo-Martínez, Carlos
Olaru, Sorin
Niculescu, Silviu-Iulian
European Commission
China Scholarship Council
Centre National de la Recherche Scientifique (France)
Trabajo presentado a la 53rd IEEE Conference on Decision and Control (CDC 2014), celebrada del 15 al 17 de diciembre en Los Angeles, California (US).
In this paper, a sensor fault-tolerant control (FTC) scheme using robust model predictive control (MPC) and set theoretic fault detection and isolation (FDI) is proposed. The MPC controller is used to both robustly control the plant and actively guarantee fault isolation (FI). In this scheme, fault detection (FD) is passive by interval observers, while fault isolation (FI) is active by MPC. The advantage of the proposed approach consists in using MPC to actively decouple the effect of sensor faults on the outputs such that one output component only corresponds to one sensor fault in terms of FI, which can utilize the feature of sensor faults for FI. A numerical example is used to illustrate the effectiveness of the proposed scheme.
This work has been partially supported by the EU project i-Sense (FP7-ICT-2009-6-270428), China Scholarship Council, CNRS-Supelec and Automatic Control Department, Supélec, France.
Peer Reviewed
2016-01-11T10:40:47Z
2016-01-11T10:40:47Z
2014
2016-01-11T10:40:47Z
comunicación de congreso
http://purl.org/coar/resource_type/c_5794
isbn: 978-1-4799-7746-8
IEEE 53rd Annual Conference on Decision and Control (CDC): 4953-4958 (2014)
http://hdl.handle.net/10261/127402
10.1109/CDC.2014.7040162
http://dx.doi.org/10.13039/501100000780
http://dx.doi.org/10.13039/501100004543
http://dx.doi.org/10.13039/501100004794
#PLACEHOLDER_PARENT_METADATA_VALUE#
info:eu-repo/grantAgreement/EC/FP7/270428
Postprint
http://dx.doi.org/10.1109/CDC.2014.7040163
Sí
open
Institute of Electrical and Electronics Engineers