2024-03-28T17:59:12Zhttp://digital.csic.es/dspace-oai/requestoai:digital.csic.es:10261/38452016-02-16T02:25:26Zcom_10261_90com_10261_4col_10261_469
Guerra, Oscar
Escalera, Sara
Rosa, José M. de la
Compaigne, Eric
Galliard, Christophe
Rodríguez-Vázquez, Ángel
2008-04-29T05:49:23Z
2008-04-29T05:49:23Z
2000-11
O. Guerra, S. Escalera, J.M. de la Rosa, E. Compaigne, C. Galliard and A. Rodríguez-Vázquez: "Selection of test techniques for high-resolution ΣΔ modulators”, Proceeding of the 2004 Conference on Design of Circuits and Integrated Systems, pp. 211-214, Bordeaux, November 2004.
2-9522971-0-X
http://hdl.handle.net/10261/3845
This paper introduces a new tool which allows the
evaluation of different test techniques in a complete impartial manner. This tool has been applied to the selection of the best
test technique for their application to high-resolution ΣΔ modulators. Besides, three of these techniques have been presented.
eng
openAccess
Test
Sigma-Delta Modulators
Selection of test techniques for high-resolution ΣΔ modulators
artículo