2024-03-29T08:09:47Zhttp://digital.csic.es/dspace-oai/requestoai:digital.csic.es:10261/37942016-02-16T02:25:20Zcom_10261_90com_10261_4col_10261_469
Escalera, Sara
García-González, José Manuel
Guerra, Oscar
Rosa, José M. de la
Medeiro, Fernando
Pérez-Verdú, Belén
Rodríguez-Vázquez, Ángel
2008-04-28T11:10:36Z
2008-04-28T11:10:36Z
2004-05
S. Escalera, J.M. García-González, O. Guerra, J.M. de la Rosa, F. Medeiro, B. Pérez-Verdú and A. Rodríguez-Vázquez: "An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulator". Proceeding of the 2004 International Symposium on Circuits and Systems (ISCAS), pp. I.257-I.260, Vancouver, May 2004.
http://hdl.handle.net/10261/3794
0-7803-8251-X/04
In this paper, a novel DfT methodology to test high-resolution ΣΔ Modulators (ΣΔM) is introduced. The aim of the proposal is to reduce the test time required by conventional methodologies without degrading the accuracy of the results. A detailed description of the additional circuitry needed to perform these tests is presented as well as some initial simulation results to show the utility of the approach.
eng
openAccess
Design for Testability
Sigma-Delta Modulators
An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulators
artículo