2024-03-28T21:41:00Zhttp://digital.csic.es/dspace-oai/requestoai:digital.csic.es:10261/1146782020-06-11T09:09:18Zcom_10261_66com_10261_3col_10261_319
00925njm 22002777a 4500
dc
González, J. A.
author
Feliú Jr., S.
author
Bautista, A.
author
Otero, Eduardo
author
Feliú Batlle, Sebastián
author
1999
EIS in the 100 kHz-1 mHz frequency range was applied to the study of changes in cold sealed aluminum oxide films exposed to highly wet and extremely dry atmospheres. Information about these changes was obtained from evolution of the impedance diagrams and, in particular, from film resistance and capacitance values determined from them. Results show that sealing quality, assessed from EIS, increases over months and years as ageing proceeds in a natural atmosphere. The analysis was completed with the aid of XPS and EDX techniques and standard quality control tests. Measurements show that specimens aged very rapidly in wet atmospheres, so that they passed all sealing quality tests within 72 h. The sealing quality improves with ageing even in highly dry atmospheres despite the fact that pores lose part of their initial filling water. XPS analysis revealed that fluorine and nickel concentrate in the outer layers of cold sealed anodic films; on the other hand, films obtained by the traditional HTS procedure exhibit a uniform composition throughout their thickness.
Journal of Applied Electrochemistry 29 (7): 845-854 (1999)
http://hdl.handle.net/10261/114678
10.1023/A:1003569330080
Aluminium
Ageing
Sealing quality
Cold sealing
Highly dry atmosphere
Anodizing
Changes in cold sealed aluminum oxide films during ageing