2024-03-29T12:43:48Zhttp://digital.csic.es/dspace-oai/requestoai:digital.csic.es:10261/445342016-02-17T09:21:54Zcom_10261_10252com_10261_3col_10261_10253
2012-01-20T12:48:24Z
urn:hdl:10261/44534
Comment on “Nanometer resolution piezoresponse force microscopy to study deep submicron ferroelectric and ferroelastic domains” [ Appl. Phys. Lett. 94, 162903 (2009)]
Vlooswijk, A. H. G.
Catalán, Gustau
Noheda, Beatriz
2 páginas, 1 figura.
2012-01-20T12:48:24Z
2012-01-20T12:48:24Z
2010-07
artículo
Applied Physics Letters 97(4): 046101 (2010)
0003-6951
http://hdl.handle.net/10261/44534
10.1063/1.3467005
1077-3118
eng
http://dx.doi.org/10.1063/1.3467005
openAccess
American Institute of Physics